Invention Grant
- Patent Title: X-ray system and method for sampling image data
- Patent Title (中): X射线系统和图像数据采样方法
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Application No.: US13011033Application Date: 2011-01-21
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Publication No.: US08576986B2Publication Date: 2013-11-05
- Inventor: James Zhengshe Liu , Paul Richard Granfors , Kenneth Scott Kump , Ping Xue , Donald Fayette Langler , Brian John Kost
- Applicant: James Zhengshe Liu , Paul Richard Granfors , Kenneth Scott Kump , Ping Xue , Donald Fayette Langler , Brian John Kost
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: H05G1/64
- IPC: H05G1/64 ; H05G1/46 ; G01T1/20

Abstract:
An X-ray imaging method includes in a digital X-ray detector including an array of discrete picture elements each including a photodiode and a transistor, applying a first voltage to the transistors of the discrete picture elements. The method also includes preparing for acquisition of X-ray image data by sampling data from the discrete picture elements while applying a second voltage to the transistors of the discrete picture elements not then being sampled, the second voltage being more negative than the first voltage. The method further includes receiving X-ray radiation on the detector from a source. The method yet further includes sampling X-ray image data from the discrete picture elements while applying the second voltage to the transistors of the discrete picture elements not then being sampled.
Public/Granted literature
- US20120189100A1 X-RAY SYSTEM AND METHOD FOR SAMPLING IMAGE DATA Public/Granted day:2012-07-26
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