发明授权
US08578253B2 Systems and methods for updating detector parameters in a data processing circuit 有权
用于更新数据处理电路中检测器参数的系统和方法

Systems and methods for updating detector parameters in a data processing circuit
摘要:
Various embodiments of the present invention provide systems and methods for updating detector parameters in a data processing circuit. For example, a data processing circuit is disclosed that includes a first detector circuit, a second detector circuit, and a calibration circuit. The first detector circuit is operable to receive a first data set and to apply a data detection algorithm to the first data set, and the second detector circuit is operable to receive a second data set and to apply the data detection algorithm to the second data set. The calibration circuit is operable to calculate a data detection parameter based upon a third data set. The data detection parameter is used by the first detector circuit in applying the data detection algorithm to the first data set during a period that the data detection parameter is used by the second detector circuit in applying the data detection algorithm to the second data set.
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