发明授权
- 专利标题: Semiconductor memory device
- 专利标题(中): 半导体存储器件
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申请号: US13046894申请日: 2011-03-14
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公开(公告)号: US08581305B2公开(公告)日: 2013-11-12
- 发明人: Yoshiaki Fukuzumi , Hideaki Aochi
- 申请人: Yoshiaki Fukuzumi , Hideaki Aochi
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2010-068136 20100324
- 主分类号: H01L23/525
- IPC分类号: H01L23/525
摘要:
A semiconductor memory device according to one embodiment of the present invention includes a dielectric film configured to store information depending on presence or absence of a conductive path therein, and a plurality of electrodes provided to contact a first surface of the dielectric film. The conductive path can be formed between two electrodes arbitrarily selected form the plurality of electrodes. The conductive path has a rectifying property of allowing a current to flow more easily in a first direction connecting arbitrary two electrodes than in a second direction opposite to the first direction. The largest possible number of the conductive paths that may be formed is larger than the number of the plurality of electrodes.
公开/授权文献
- US20110235436A1 SEMICONDUCTOR MEMORY DEVICE 公开/授权日:2011-09-29
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