发明授权
US08582068B2 Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device
有权
具有开关元件连接和检查布线的有源矩阵基板，显示装置，有源矩阵基板检查方法以及检查显示装置的方法
- 专利标题： Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device
- 专利标题（中）： 具有开关元件连接和检查布线的有源矩阵基板，显示装置，有源矩阵基板检查方法以及检查显示装置的方法
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申请号： US12934896申请日： 2009-04-28
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公开(公告)号： US08582068B2公开(公告)日： 2013-11-12
- 发明人: Takehiko Kawamura , Kazunori Tanimoto , Isao Ogasawara , Masahiro Yoshida , Hideaki Takizawa
- 申请人： Takehiko Kawamura , Kazunori Tanimoto , Isao Ogasawara , Masahiro Yoshida , Hideaki Takizawa
- 申请人地址： JP Osaka-shi
- 专利权人： Sharp Kabushiki Kaisha
- 当前专利权人： Sharp Kabushiki Kaisha
- 当前专利权人地址： JP Osaka-shi
- 代理机构： Birch, Stewart, Kolasch & Birch, LLP
- 优先权： JP2008-129866 20080516
- 国际申请： PCT/JP2009/058317 WO 20090428
- 国际公布： WO2009/139290 WO 20091119
- 主分类号： G02F1/1345
- IPC分类号： G02F1/1345 ; G02F1/136 ; G09G3/36 ; H01L29/04
摘要：
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
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