发明授权
- 专利标题: Method and apparatus for characterizing and reducing proximity effect on cell electrical characteristics
- 专利标题(中): 用于表征和减少对电池电特性的接近效应的方法和装置
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申请号: US13027359申请日: 2011-02-15
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公开(公告)号: US08584075B2公开(公告)日: 2013-11-12
- 发明人: Animesh Datta , Pratyush Kamal , Prayag B. Patel , Xiaonan Zhang
- 申请人: Animesh Datta , Pratyush Kamal , Prayag B. Patel , Xiaonan Zhang
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: US CA San Diego
- 代理商 Sam Talpalatsky; Nicholas J. Pauley; Joseph Agusta
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Circuit elements are characterized for effects of proximity context on electrical characteristic. Based on the characterization, proximity context cell models, and corresponding modeled electrical characteristic values are obtained. Logic cells are characterized and modeled according to the proximity context cell models. Optionally the electrical characteristic can be time delay, leakage, dynamic power, or coupling noise among other parameters.
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