发明授权
- 专利标题： Spectral detector calibration
- 专利标题（中）： 光谱检测器校准
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申请号： US12934661申请日： 2009-03-20
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公开(公告)号： US08585286B2公开(公告)日： 2013-11-19
- 发明人: Amir Livne , Naor Wainer , Jens-Peter Schlomka , Ewald Roessl , Roland Proksa
- 申请人： Amir Livne , Naor Wainer , Jens-Peter Schlomka , Ewald Roessl , Roland Proksa
- 申请人地址： NL Eindhoven
- 专利权人： Koninklijke Philips N.V.
- 当前专利权人： Koninklijke Philips N.V.
- 当前专利权人地址： NL Eindhoven
- 国际申请： PCT/IB2009/051189 WO 20090320
- 国际公布： WO2009/122317 WO 20091008
- 主分类号： G01D18/00
- IPC分类号： G01D18/00
摘要：
A method includes detecting radiation that traverses a material having a known spectral characteristic with a radiation sensitive detector pixel that outputs a signal indicative of the detected radiation and determining a mapping between the output signal and the spectral characteristic. The method further includes determining an energy of a photon detected by the radiation sensitive detector pixel based on a corresponding output of the radiation sensitive detector pixel and the mapping.
公开/授权文献
- US20110012014A1 SPECTRAL DETECTOR CALIBRATION 公开/授权日：2011-01-20
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