发明授权
US08585862B2 Plasma processing device and plasma discharge state monitoring device
有权
等离子体处理装置和等离子体放电状态监测装置
- 专利标题: Plasma processing device and plasma discharge state monitoring device
- 专利标题(中): 等离子体处理装置和等离子体放电状态监测装置
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申请号: US12598815申请日: 2008-08-21
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公开(公告)号: US08585862B2公开(公告)日: 2013-11-19
- 发明人: Tatsuhiro Mizukami , Kiyoshi Arita , Masaru Nonomura
- 申请人: Tatsuhiro Mizukami , Kiyoshi Arita , Masaru Nonomura
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Pearne & Gordon LLP
- 优先权: JPP2007-214322 20070821; JPP2007-214324 20070821
- 国际申请: PCT/JP2008/065351 WO 20080821
- 国际公布: WO2009/025393 WO 20090226
- 主分类号: H01L21/3065
- IPC分类号: H01L21/3065 ; C23C16/52 ; C23C16/505 ; C23C16/50
摘要:
An object is to provide a plasma processing device capable of highly accurately monitoring an operation state including whether or not the plasma discharge is executed, whether the discharge is normal or abnormal and whether or not the maintenance work of the vacuum chamber is necessary.A discharge detection sensor 23, in which a dielectric member 21 and a probe electrode unit 22 are combined with each other, is attached to an opening portion 2a provided in a lid portion 2 composing a vacuum chamber. A change in electric potential induced according to a change in plasma discharge in a probe electrode is received by a plurality of wave-form detecting portions and a detection signal is outputted each time a change in electric potential agreeing with a predetermined different condition appears. The detection signal outputted from the corresponding wave-form detecting portion is counted by the plurality of wave-form detecting portions and the counted value is held. According to the counted value, an operation state is highly accurately monitored which includes whether or not the plasma discharge is executed, whether the discharge is normal or abnormal and whether or not the maintenance work of the vacuum chamber is necessary.
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