Invention Grant
US08587320B2 System and method for testing a secondary servo control circuit in a redundant control configuration
有权
用于在冗余控制配置中测试辅助伺服控制电路的系统和方法
- Patent Title: System and method for testing a secondary servo control circuit in a redundant control configuration
- Patent Title (中): 用于在冗余控制配置中测试辅助伺服控制电路的系统和方法
-
Application No.: US12942115Application Date: 2010-11-09
-
Publication No.: US08587320B2Publication Date: 2013-11-19
- Inventor: Dinesh Kumar Kn , Nagaraja Sundaresh , Karthik Giritharan , Srinivasan Rajagopal , Amol Kinage , Rakesh Damodaran Nair , Sai Krishnan Jagannathan , Sunil M. Ingawale , Sachin Kumar
- Applicant: Dinesh Kumar Kn , Nagaraja Sundaresh , Karthik Giritharan , Srinivasan Rajagopal , Amol Kinage , Rakesh Damodaran Nair , Sai Krishnan Jagannathan , Sunil M. Ingawale , Sachin Kumar
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/08

Abstract:
A system, apparatus and method are provided for testing a secondary servo control circuit in a redundant control configuration. A first circuit is configured to receive a control signal and to control an attribute of an actuator based on the control signal using a first control input of the actuator. A second circuit is configured to test operation of an actuator circuit using a test signal. The actuator circuit includes at least part of the second circuit and a second control input of the actuator. The test signal is selected to avoid causing independent motion of the actuator. The actuator could be a dual coil servo valve, and the test signal could be a current (such as a DC current, an AC current, or a pulsed current) having a magnitude less than a bias current of the actuator.
Public/Granted literature
- US20120112759A1 SYSTEM AND METHOD FOR TESTING A SECONDARY SERVO CONTROL CIRCUIT IN A REDUNDANT CONTROL CONFIGURATION Public/Granted day:2012-05-10
Information query