Invention Grant
US08587844B2 Image inspecting apparatus, image inspecting method, and image forming apparatus
有权
图像检查装置,图像检查方法和图像形成装置
- Patent Title: Image inspecting apparatus, image inspecting method, and image forming apparatus
- Patent Title (中): 图像检查装置,图像检查方法和图像形成装置
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Application No.: US13067382Application Date: 2011-05-27
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Publication No.: US08587844B2Publication Date: 2013-11-19
- Inventor: Hitoshi Itoh , Fumihiro Nakashige , Keiji Kojima
- Applicant: Hitoshi Itoh , Fumihiro Nakashige , Keiji Kojima
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2010-136432 20100615
- Main IPC: H04N1/04
- IPC: H04N1/04

Abstract:
An image inspecting apparatus includes a first light illuminating unit irradiating a measured object on which an image is formed with light from an inclined direction; a second light illuminating unit irradiating the measured object with light from a different direction; an imaging unit receiving reflected light of the light with which the measured object is irradiated by the first light illuminating unit and the second light illuminating unit; a first and a second reference plate having a mirror surface and a diffuse surface, respectively; and an image inspecting unit inspecting a gloss distribution of the image based on the amount of light received by the imaging unit and a correcting coefficient.
Public/Granted literature
- US20110304862A1 Image inspecting apparatus, image inspecting method, and image forming apparatus Public/Granted day:2011-12-15
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