Invention Grant
US08587997B2 Memory system to determine interference of a memory cell by adjacent memory cells, and operating method thereof
有权
用于确定相邻存储单元的存储单元的干扰的存储器系统及其操作方法
- Patent Title: Memory system to determine interference of a memory cell by adjacent memory cells, and operating method thereof
- Patent Title (中): 用于确定相邻存储单元的存储单元的干扰的存储器系统及其操作方法
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Application No.: US13016063Application Date: 2011-01-28
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Publication No.: US08587997B2Publication Date: 2013-11-19
- Inventor: Jaehong Kim , Kijun Lee , Yong June Kim , Heeseok Eun
- Applicant: Jaehong Kim , Kijun Lee , Yong June Kim , Heeseok Eun
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG Electronics Co., Ltd.
- Current Assignee: SAMSUNG Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Stanzione & Kim, LLP
- Priority: KR10-2010-0018660 20100302
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04
Abstract:
Provided are a memory system and an operating method thereof. The operating method reads an observation memory cell at least one time with different read voltages to configure a first read data symbol, reads a plurality of interference memory cells adjacent to the observation memory cell at least one time with different read voltages to configure second read data symbols, and determines a logical value of the observation memory cell based on the first read data symbol and the second read data symbols.
Public/Granted literature
- US20110216598A1 MEMORY SYSTEM AND OPERATING METHOD THEREOF Public/Granted day:2011-09-08
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