发明授权
- 专利标题： Methods and apparatus for providing a built-in self test
- 专利标题（中）： 提供内置自检的方法和设备
-
申请号： US12836462申请日： 2010-07-14
-
公开(公告)号： US08589750B2公开(公告)日： 2013-11-19
- 发明人: Gaurab Banerjee , Manas Behera , Kenneth Charles Barnett
- 申请人： Gaurab Banerjee , Manas Behera , Kenneth Charles Barnett
- 申请人地址： US CA San Diego
- 专利权人： QUALCOMM, Incorporated
- 当前专利权人： QUALCOMM, Incorporated
- 当前专利权人地址： US CA San Diego
- 代理商 William M. Hooks
- 主分类号： H03M13/00
- IPC分类号： H03M13/00
摘要：
A built-in self test (BiST) system is described. The BiST system includes a circuit-under-test. The BiST system also includes one or more embedded sensors. Each of the embedded sensors includes one or more switches connected to one or more nodes within the circuit-under-test. The BiST system further includes a signal generator. The BiST system also includes a bus interface. The bus interface provides for external access of the BiST system.
公开/授权文献
- US20120017131A1 METHODS AND APPARATUS FOR PROVIDING A BUILT-IN SELF TEST 公开/授权日：2012-01-19
信息查询
IPC分类:
