Invention Grant
- Patent Title: Refractive index measuring apparatus
- Patent Title (中): 折射率测量装置
-
Application No.: US12990547Application Date: 2010-01-21
-
Publication No.: US08593624B2Publication Date: 2013-11-26
- Inventor: Yusuke Kusaka , Yohei Takechi , Atsushi Fukui , Seiji Hamano , Kazumasa Takata
- Applicant: Yusuke Kusaka , Yohei Takechi , Atsushi Fukui , Seiji Hamano , Kazumasa Takata
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2009-011530 20090122
- International Application: PCT/JP2010/000311 WO 20100121
- International Announcement: WO2010/084748 WO 20100729
- Main IPC: G01N21/41
- IPC: G01N21/41

Abstract:
By using two probe optical systems for measurement by disposing the probe optical systems with a test object sandwiched therebetween, an optical path length of light transmitted through the test object which is identified locally is calculated using an interference signal thereof. In addition, a geometrical thickness of the same part is calculated by measuring positions of the probe optical systems, whereby two calculated values are obtained. Based on the values and a calculated value for a reference object, a refractive index distribution of the test object is obtained.
Public/Granted literature
- US20110051127A1 REFRACTIVE INDEX MEASURING APPARATUS Public/Granted day:2011-03-03
Information query