Invention Grant
- Patent Title: Metrics capability self assessment
- Patent Title (中): 指标能力自我评估
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Application No.: US10745989Application Date: 2003-12-24
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Publication No.: US08595051B2Publication Date: 2013-11-26
- Inventor: Paul A. Below , Debra L. Maschino , Sanjay Kumar , Lynne L. Palmer , Dorothy J. Easterday
- Applicant: Paul A. Below , Debra L. Maschino , Sanjay Kumar , Lynne L. Palmer , Dorothy J. Easterday
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G06Q10/00
- IPC: G06Q10/00

Abstract:
A method, system, and computer program product for systematically collecting metrics implementation data for use by an enterprise. A metrics capability self assessment (MCSA) system determines a set of information sections important in evaluating implementation of metrics for an organization within the enterprise. The MCSA system also determines a set of questions to measure the degree of implementation of metrics within each information section. The MCSA system then presents the questions to each organization and project site within the organization on a periodic basis to ensure a systematic collection of information. Based on the answers, a scale is assigned to each group site or project site within the organization, wherein the scale provides a simple means of determining the level of metrics implementation of a group. Responses from the various project sites and organization sites may then be grouped into statistical information for presentation to a user.
Public/Granted literature
- US20050144592A1 Metrics capability self assessment Public/Granted day:2005-06-30
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