Invention Grant
- Patent Title: Inductively coupled plasma processing apparatus
- Patent Title (中): 电感耦合等离子体处理装置
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Application No.: US12686756Application Date: 2010-01-13
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Publication No.: US08597463B2Publication Date: 2013-12-03
- Inventor: Kazuo Sasaki
- Applicant: Kazuo Sasaki
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-005843 20090114; JP2009-147190 20090622; JP2009-274433 20091202
- Main IPC: C23C16/00
- IPC: C23C16/00 ; H01L21/306

Abstract:
An inductively coupled plasma processing apparatus includes a processing chamber for accommodating a target substrate to be processed and performing plasma processing thereon, a mounting table provided in the processing chamber for mounting thereon the target substrate, a processing gas supply system for supplying a processing gas into the processing chamber and a gas exhaust system for exhausting the inside of the processing chamber. Further, in the inductively coupled plasma processing apparatus, a high frequency antenna is provided to form an inductive electric field in the processing chamber and a first high frequency power supply is provided to supply a high frequency power to the high frequency antenna. A metal window made of a nonmagnetic and conductive material is formed between the high frequency antenna and the processing chamber while being insulated from a main body which forms the processing chamber.
Public/Granted literature
- US20100175831A1 INDUCTIVELY COUPLED PLASMA PROCESSING APPARATUS Public/Granted day:2010-07-15
Information query
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