Invention Grant
- Patent Title: Automatic analyzing method and apparatus for microfluidic system
- Patent Title (中): 微流体系统的自动分析方法和装置
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Application No.: US12128680Application Date: 2008-05-29
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Publication No.: US08597572B2Publication Date: 2013-12-03
- Inventor: Su-hyeon Kim , Yoon-kyoung Cho , Jeong-gun Lee
- Applicant: Su-hyeon Kim , Yoon-kyoung Cho , Jeong-gun Lee
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2007-0102139 20071010
- Main IPC: G01N33/50
- IPC: G01N33/50
Abstract:
Provided are an automatic analyzing method and apparatus for a microfludic system. The apparatus includes means for recognizing a disc or chip in the microfludic system, performs an operation and detection by automatically loading a DB according to a recognized type, and perform quantization of a test.
Public/Granted literature
- US20090099782A1 AUTOMATIC ANALYZING METHOD AND APPARATUS FOR MICROFLUIDIC SYSTEM Public/Granted day:2009-04-16
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