Invention Grant
- Patent Title: Critical-angle refractometery
- Patent Title (中): 临界角度屈光仪
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Application No.: US13071899Application Date: 2011-03-25
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Publication No.: US08605271B2Publication Date: 2013-12-10
- Inventor: Jeff A. Wagner
- Applicant: Jeff A. Wagner
- Applicant Address: US NJ Hackettstown
- Assignee: Rudolph Research Analytical Inc.
- Current Assignee: Rudolph Research Analytical Inc.
- Current Assignee Address: US NJ Hackettstown
- Agency: Kaplan, Breyer, Schwarz & Ottesen, LLP
- Main IPC: G01N21/41
- IPC: G01N21/41

Abstract:
A critical-angle refractometer which utilizes an in image of light reflected from an optical interface with a vessel containing a sample under test to determine an optical property of the sample, sample properties are evaluated to prevent improper testing of the sample. This evaluation includes establishing reflectance information associating the amount of reflection with locations in the image; and utilizing a plurality of properties of the reflectance information to determine if the vessel contains a proper sample under test.
Public/Granted literature
- US20120242981A1 Critical-Angle Refractometery Public/Granted day:2012-09-27
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