Invention Grant
US08606102B2 Test interface device, test system and optical interface memory device
有权
测试接口设备,测试系统和光接口存储设备
- Patent Title: Test interface device, test system and optical interface memory device
- Patent Title (中): 测试接口设备,测试系统和光接口存储设备
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Application No.: US12592817Application Date: 2009-12-03
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Publication No.: US08606102B2Publication Date: 2013-12-10
- Inventor: Sang-Hoon Lee , Eun-Jo Byun , Cheol-Jong Woo , Se-Jang Oh
- Applicant: Sang-Hoon Lee , Eun-Jo Byun , Cheol-Jong Woo , Se-Jang Oh
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP
- Priority: KR10-2008-0126070 20081211
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B17/00

Abstract:
A test interface device includes a serializer, an optical transmitter, an optical receiver, and a deserializer. The serializer receives parallel test signals from automatic test equipment, and serializes the parallel test signals into a serial test signal. The optical transmitter converts the serial test signal into an optical test signal. The optical receiver receives the optical test signal from the optical transmitter, and converts the optical test signal into the serial test signal. The deserializer deserializes the serial test signal into the parallel test signals, and transmits the parallel test signals to a device under test. As a result, signal transfer speed may be improved and optical resource usage may be reduced.
Public/Granted literature
- US20100150549A1 Test interface device, test system and optical interface memory device Public/Granted day:2010-06-17
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