发明授权
US08617417B2 Cleaning composition, method for producing semiconductor device, and cleaning method
有权
清洗组合物,半导体装置的制造方法以及清洗方法
- 专利标题: Cleaning composition, method for producing semiconductor device, and cleaning method
- 专利标题(中): 清洗组合物,半导体装置的制造方法以及清洗方法
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申请号: US13107199申请日: 2011-05-13
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公开(公告)号: US08617417B2公开(公告)日: 2013-12-31
- 发明人: Tadashi Inaba , Kazutaka Takahashi , Tomonori Takahashi , Atsushi Mizutani
- 申请人: Tadashi Inaba , Kazutaka Takahashi , Tomonori Takahashi , Atsushi Mizutani
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2010-111885 20100514
- 主分类号: C09K13/00
- IPC分类号: C09K13/00
摘要:
Provided are a cleaning composition which is capable of inhibiting the metal of a semiconductor substrate from corrosion, and has an excellent removability of plasma etching residues and/or ashing residues on the semiconductor substrate, a method for producing a semiconductor device, and a cleaning method using the cleaning composition. The cleaning composition for removing plasma etching residues and/or ashing residues formed on a semiconductor substrate, and a preparation method and a cleaning method for a semiconductor device, using the cleaning composition, wherein the cleaning composition includes (Component a) water; (Component b) an amine compound; (Component c) hydroxylamine and/or a salt thereof; (Component d) a quaternary ammonium compound; (Component e) an organic acid; and (Component f) a water-soluble organic solvent; and has a pH of 6 to 9.
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