发明授权
US08619463B2 Adaptive write bit line and word line adjusting mechanism for memory
有权
适应性写入位线和字线调整机制用于存储器
- 专利标题: Adaptive write bit line and word line adjusting mechanism for memory
- 专利标题(中): 适应性写入位线和字线调整机制用于存储器
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申请号: US13676389申请日: 2012-11-14
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公开(公告)号: US08619463B2公开(公告)日: 2013-12-31
- 发明人: Hank Cheng , Ming-Zhang Kuo , Chung-Cheng Chou
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman & Ham, LLP
- 主分类号: G11C11/24
- IPC分类号: G11C11/24 ; G11C5/14 ; G11C8/00
摘要:
A memory including a capacitor coupled to a write bit line or a word line and an initializer configured to initialize a voltage level at a first node between the capacitor and the write bit line or the word line. The memory further includes a controllable initial level adjuster configured to adjust a voltage level of a second node at one terminal of the capacitor in response to a pulse. The capacitor is configured to receive a boost signal at a third node at a terminal opposite the first node. The boost signal configured to change a voltage level of the write bit line or the word line in response to the boost signal.
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