- 专利标题: Three dimensional structure memory
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申请号: US12405234申请日: 2009-03-17
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公开(公告)号: US08629542B2公开(公告)日: 2014-01-14
- 发明人: Glenn J. Leedy
- 申请人: Glenn J. Leedy
- 主分类号: H01L21/768
- IPC分类号: H01L21/768 ; H01L21/70
摘要:
A Three-Dimensional Structure (3DS) Memory allows for physical separation of the memory circuits and the control logic circuit onto different layers such that each layer may be separately optimized. One control logic circuit suffices for several memory circuits, reducing cost. Fabrication of 3DS memory involves thinning of the memory circuit to less than 50 μm in thickness and bonding the circuit to a circuit stack while still in wafer substrate form. Fine-grain high density inter-layer vertical bus connections are used. The 3DS memory manufacturing method enables several performance and physical size efficiencies, and is implemented with established semiconductor processing techniques.
公开/授权文献
- US20090174082A1 Three dimensional structure memory 公开/授权日:2009-07-09
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