发明授权
US08630823B2 Feature parameter candidate generation apparatus and feature parameter candidate generation method 有权
特征参数候选生成装置和特征参数候选生成方法

Feature parameter candidate generation apparatus and feature parameter candidate generation method
摘要:
A feature parameter candidate generation apparatus has a storage unit that stores the values of feature parameters extracted from each of samples, an index value calculation unit that calculates an index value, which is obtained by normalizing the number of the kinds of the values of feature parameters by the number of the samples, for each of the feature parameters, an evaluation object selection unit that selects combinations of feature parameters which are objects to be evaluated, an evaluation unit that evaluates whether the uniformity of a frequency distribution of index values of the individual feature parameters for combinations of feature parameters selected as the objects to be evaluated satisfies a predetermined criterion, and a candidate determination unit that determines, as feature parameter candidates to be given to the model generation device, a combination of feature parameters that is evaluated to satisfy the predetermined criterion.
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