发明授权
- 专利标题： Radiation detection element
- 专利标题（中）： 辐射检测元件
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申请号： US12979168申请日： 2010-12-27
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公开(公告)号： US08637828B2公开(公告)日： 2014-01-28
- 发明人: Yoshihiro Okada
- 申请人： Yoshihiro Okada
- 申请人地址： JP Tokyo
- 专利权人： FUJIFILM Corporation
- 当前专利权人： FUJIFILM Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Sughrue Mion, PLLC
- 优先权： JP2010-019406 20100129
- 主分类号： H01L27/146
- IPC分类号： H01L27/146
摘要：
The present invention provides a radiation detection element that allows repairing of a defect portion, and that minimizes the number of pixels from which charges cannot be read out when repaired. Namely, in two adjacent pixels that are connected to a signal line having a defect portion where a defect has occurred and that are adjacent to the defect portion, the signal lines and the parallel lines are short-circuited to configure a parallel circuit parallel to the defect portion.
公开/授权文献
- US20110186742A1 RADIATION DETECTION ELEMENT 公开/授权日：2011-08-04
信息查询
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