发明授权
- 专利标题: Method of making an insulated gate semiconductor device and structure
- 专利标题(中): 制造绝缘栅半导体器件和结构的方法
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申请号: US13482920申请日: 2012-05-29
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公开(公告)号: US08642425B2公开(公告)日: 2014-02-04
- 发明人: Peter A. Burke , Eric J. Ameele
- 申请人: Peter A. Burke , Eric J. Ameele
- 申请人地址: US AZ Phoenix
- 专利权人: Semiconductor Components Industries, LLC
- 当前专利权人: Semiconductor Components Industries, LLC
- 当前专利权人地址: US AZ Phoenix
- 代理商 Kevin B. Jackson
- 主分类号: H01L21/336
- IPC分类号: H01L21/336
摘要:
In one embodiment, a trench shield electrode layer is separated from a trench gate electrode by an inter-electrode dielectric layer. A conformal deposited dielectric layer is formed as part of a gate dielectric structure and further isolates the trench shield electrode from the trench gate electrode. The conformal deposited dielectric layer is formed using an improved high temperature oxide (HTO) low pressure chemical vapor deposition (LPCVD) process.
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