发明授权
US08642425B2 Method of making an insulated gate semiconductor device and structure 有权
制造绝缘栅半导体器件和结构的方法

Method of making an insulated gate semiconductor device and structure
摘要:
In one embodiment, a trench shield electrode layer is separated from a trench gate electrode by an inter-electrode dielectric layer. A conformal deposited dielectric layer is formed as part of a gate dielectric structure and further isolates the trench shield electrode from the trench gate electrode. The conformal deposited dielectric layer is formed using an improved high temperature oxide (HTO) low pressure chemical vapor deposition (LPCVD) process.
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