发明授权
- 专利标题: Method of measuring measurement target
- 专利标题(中): 测量目标的测量方法
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申请号: US13619161申请日: 2012-09-14
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公开(公告)号: US08644590B2公开(公告)日: 2014-02-04
- 发明人: Joong-Ki Jeong , Min-Young Kim , Hee-Wook You
- 申请人: Joong-Ki Jeong , Min-Young Kim , Hee-Wook You
- 申请人地址: KR Seoul
- 专利权人: Koh Young Technology Inc.
- 当前专利权人: Koh Young Technology Inc.
- 当前专利权人地址: KR Seoul
- 代理机构: Kile Park Reed & Houtteman PLLC
- 优先权: KR10-2009-0041514 20090513; KR10-2010-0034057 20100414; KR10-2010-0043731 20100511
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T1/00 ; G01J3/50
摘要:
In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured.
公开/授权文献
- US20130010102A1 METHOD OF MEASURING MEASUREMENT TARGET 公开/授权日:2013-01-10
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