发明授权
- 专利标题: Impedance variability analysis to identify lead-related conditions
- 专利标题(中): 阻抗变异性分析来识别铅相关条件
-
申请号: US12180304申请日: 2008-07-25
-
公开(公告)号: US08644931B2公开(公告)日: 2014-02-04
- 发明人: Robert W. Stadler , Bruce D. Gunderson , Amisha S. Patel
- 申请人: Robert W. Stadler , Bruce D. Gunderson , Amisha S. Patel
- 申请人地址: US MN Minneapolis
- 专利权人: Medtronic, Inc.
- 当前专利权人: Medtronic, Inc.
- 当前专利权人地址: US MN Minneapolis
- 代理商 Michael J. Ostrom
- 主分类号: A61N1/00
- IPC分类号: A61N1/00
摘要:
In general, the disclosure relates to techniques for calculating mean impedance values and impedance variability values to detect a possible condition with a lead or device-lead pathway or connection. In one example, a device may be configured to determine an impedance value for an electrical path based on a plurality of measured impedance values for the electrical path, wherein the electrical path comprises a plurality of electrodes, and to determine an impedance variability value based on at least one of the plurality of measured impedance values. The device may be further configured to determine a threshold value based on the determined impedance value and the impedance variability value, compare a newly measured impedance value for the electrical path to the threshold value, and indicate a possible condition of the electrical path based on the comparison.
公开/授权文献
信息查询