Invention Grant
US08648326B2 Phase change memory electrode with sheath for reduced programming current
有权
具有护套的相变记忆电极,用于减少编程电流
- Patent Title: Phase change memory electrode with sheath for reduced programming current
- Patent Title (中): 具有护套的相变记忆电极,用于减少编程电流
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Application No.: US13191490Application Date: 2011-07-27
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Publication No.: US08648326B2Publication Date: 2014-02-11
- Inventor: Matthew J. Breitwisch , Bipin Rajendran
- Applicant: Matthew J. Breitwisch , Bipin Rajendran
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ido Tuchman; Vazken Alexanian
- Main IPC: H01L45/00
- IPC: H01L45/00

Abstract:
An example embodiment is a phase change memory cell that includes a bottom contact and an electrically insulating layer disposed over the bottom contact. The electrically insulating layer defines an elongated via. Furthermore, a bottom electrode is disposed at least partially in the via. The bottom electrode includes a sleeve of a first electrically conductive material surrounding a rod of a second electrically conductive material. The first electrically conductive material and the second electrically conductive material have different specific electrical resistances. The memory cell also includes a phase change layer electrically coupled to the first electrode.
Public/Granted literature
- US20130026436A1 PHASE CHANGE MEMORY ELECTRODE WITH SHEATH FOR REDUCED PROGRAMMING CURRENT Public/Granted day:2013-01-31
Information query
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