发明授权
US08652923B2 Nonvolatile memory device having an electrode interface coupling region
有权
具有电极接口耦合区域的非易失性存储器件
- 专利标题: Nonvolatile memory device having an electrode interface coupling region
- 专利标题(中): 具有电极接口耦合区域的非易失性存储器件
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申请号: US13829194申请日: 2013-03-14
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公开(公告)号: US08652923B2公开(公告)日: 2014-02-18
- 发明人: Yun Wang , Tony P. Chiang , Imran Hashim
- 申请人: Intermolecular Inc. , Kabushiki Kaisha Toshiba , SanDisk 3D LLC
- 申请人地址: US CA San Jose JP Tokyo US CA Milpitas
- 专利权人: Intermolecular, Inc.,Kabushiki Kaisha Toshiba,SanDisk 3D LLC
- 当前专利权人: Intermolecular, Inc.,Kabushiki Kaisha Toshiba,SanDisk 3D LLC
- 当前专利权人地址: US CA San Jose JP Tokyo US CA Milpitas
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
Embodiments of the invention generally relate to a resistive switching nonvolatile memory device having an interface layer structure disposed between at least one of the electrodes and a variable resistance layer formed in the nonvolatile memory device, and a method of forming the same. Typically, resistive switching memory elements may be formed as part of a high-capacity nonvolatile memory integrated circuit, which can be used in various electronic devices, such as digital cameras, mobile telephones, handheld computers, and music players. In one configuration of the resistive switching nonvolatile memory device, the interface layer structure comprises a passivation region, an interface coupling region, and/or a variable resistance layer interface region that are configured to adjust the nonvolatile memory device's performance, such as lowering the formed device's switching currents and reducing the device's forming voltage, and reducing the performance variation from one formed device to another.
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