Invention Grant
- Patent Title: Measuring macrocell quality using femtocell
- Patent Title (中): 使用毫微微小区测量宏小区质量
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Application No.: US13447414Application Date: 2012-04-16
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Publication No.: US08655347B2Publication Date: 2014-02-18
- Inventor: Ki-Ho Lee , Yong-Gyoo Lee , Yung-Ha Ji
- Applicant: Ki-Ho Lee , Yong-Gyoo Lee , Yung-Ha Ji
- Applicant Address: KR Gyeonggi-do
- Assignee: KT Corporation
- Current Assignee: KT Corporation
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP Legal Services, LLC
- Priority: KR10-2011-0034853 20110414
- Main IPC: H04W4/00
- IPC: H04W4/00

Abstract:
The disclosure is related to measuring macrocell quality of a macrocell using femtocells. A method may be provided for measuring macrocell quality of at least one macrocell using a femtocell base station. The method may include measuring, by the femtocell base station, macrocell quality of at least one macrocell based on event information, generating macrocell quality report information based on a result of the measuring, and transmitting the generated macrocell quality report information to a server through a femtocell gateway. The measuring macrocell quality may include determining whether a macrocell identifier is present in the event information, measuring the macrocell quality of a target macrocell corresponding to the mermen identifier of the event when the macrocell identifier is present in the event information, and measuring the macrocell quality of substantially all neighbor macrocells when the macrocell identifier is absent from the event information.
Public/Granted literature
- US20120264419A1 MEASURING MACROCELL QUALITY USING FEMTOCELL Public/Granted day:2012-10-18
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