发明授权
- 专利标题： Eccentricity measuring method
- 专利标题（中）： 偏心测量方法
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申请号： US13640709申请日： 2011-04-05
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公开(公告)号： US08665425B2公开(公告)日： 2014-03-04
- 发明人: Kazuyuki Ogura , Masahiro Okitsu , Youichi Ogawa , Kyu Takada
- 申请人： Kazuyuki Ogura , Masahiro Okitsu , Youichi Ogawa , Kyu Takada
- 申请人地址： JP Tokyo
- 专利权人： Konica Minolta Advanced Layers, Inc.
- 当前专利权人： Konica Minolta Advanced Layers, Inc.
- 当前专利权人地址： JP Tokyo
- 代理机构： Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权： JP2010-092057 20100413
- 国际申请： PCT/JP2011/002018 WO 20110405
- 国际公布： WO2011/129068 WO 20111020
- 主分类号： G01B9/00
- IPC分类号： G01B9/00 ; G01M11/02
摘要：
In an eccentricity measuring method according to the present invention, a first position of a light source image formed by reflection at one optical surface is measured (S2), a predetermined second position related to another optical surface is measured (S3), and a relative eccentricity between both optical surfaces is calculated based on the first and second positions (S5). Therefore, the eccentricity measuring method enables measurement of eccentricity by a same measurement optical system regardless of a radius of curvature of an optical surface of an optical element.
公开/授权文献
- US20130027692A1 ECCENTRICITY MEASURING METHOD 公开/授权日：2013-01-31