A novel RFID tag-bending test apparatus and a related method of using the novel RFID tag-bending test apparatus are disclosed. In one embodiment of the invention, the novel RFID tag-bending test apparatus can place a plurality of RFID tags in corresponding tag holding clips on the novel RFID tag-bending test apparatus to execute a bending test sequence along a particular bending axis for each RFID tag. The bending test sequence can assist identifying defective RFID tags which cannot overcome external bending pressures asserted by the novel RFID tag-bending test apparatus. By excluding these defective RFID tags from a commercial shipment of RFID tags to customers, a manufacturer of RFID tags may be able to reduce a rate of premature RFID tag failures due to external bending pressures in real-life applications of RFID tags, thereby achieving a higher quality assurance and reliability of RFID tags.