Invention Grant
- Patent Title: System and method for probing work pieces
- Patent Title (中): 探测工件的系统和方法
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Application No.: US12667106Application Date: 2008-06-27
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Publication No.: US08674714B2Publication Date: 2014-03-18
- Inventor: Anton Theodore Kitai , Paul Andrew Labelle , Robert Glenn Parker , David R. Walker
- Applicant: Anton Theodore Kitai , Paul Andrew Labelle , Robert Glenn Parker , David R. Walker
- Applicant Address: CA Ottawa
- Assignee: PPI Systems, Inc.
- Current Assignee: PPI Systems, Inc.
- Current Assignee Address: CA Ottawa
- Agency: Shumaker & Sieffert, P.A.
- International Application: PCT/CA2008/001195 WO 20080627
- International Announcement: WO2009/003277 WO 20090108
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A system and method of probing work pieces is described. A first and second arm each having a pivot point and a guide end are pivotally coupled together at the respective pivot points. A probe tip holder is coupled to at least one of the first arm or the second arm. A guide means guides movement of the guide ends of the pivotally coupled arms, such that movement of the guide end of the first arm and the second arm move the probe tip holder in a plane parallel to the work piece surface.
Public/Granted literature
- US20100271058A1 SYSTEM AND METHOD FOR PROBING WORK PIECES Public/Granted day:2010-10-28
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