发明授权
- 专利标题: Photometer and analyzing system provided with photometer
- 专利标题(中): 配有光度计的光度计和分析系统
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申请号: US13141378申请日: 2009-12-22
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公开(公告)号: US08675187B2公开(公告)日: 2014-03-18
- 发明人: Kunio Harada , Sakuichiro Adachi , Isao Yamazaki
- 申请人: Kunio Harada , Sakuichiro Adachi , Isao Yamazaki
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2008-326796 20081224
- 国际申请: PCT/JP2009/007096 WO 20091222
- 国际公布: WO2010/073604 WO 20100701
- 主分类号: G01J1/00
- IPC分类号: G01J1/00
摘要:
In an analysis system for detecting amounts of components contained in samples, many samples can be measured simultaneously in the whole of the system by use of compact inexpensive photometers. An LED with low heat generation and a long life span is used as a light source. Compactness is achieved by bended optical axis instead of a straight one. Components for bending an optical axis and components for condensing light to ensure an amount of light are in common use to reduce the number of components. Compactness, reduction of the number of components, and integration achieve easy optical axis alignment and precise measurement.
公开/授权文献
- US20110255090A1 PHOTOMETER AND ANALYZING SYSTEM PROVIDED WITH PHOTOMETER 公开/授权日:2011-10-20
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