发明授权
- 专利标题: Catadioptric imaging system for broad band microscopy
- 专利标题(中): 反射折射成像系统用于宽带显微镜
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申请号: US10646073申请日: 2003-08-22
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公开(公告)号: US08675276B2公开(公告)日: 2014-03-18
- 发明人: David R. Shafer , Yung-Ho Chuang , J. Joseph Armstrong
- 申请人: David R. Shafer , Yung-Ho Chuang , J. Joseph Armstrong
- 申请人地址: US CA Milpitas
- 专利权人: KLA-Tencor Corporation
- 当前专利权人: KLA-Tencor Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Smyrski Law Group, A P.C.
- 主分类号: G02B17/00
- IPC分类号: G02B17/00 ; G02B21/00 ; G02B23/00
摘要:
A system and method for inspection is disclosed. The design includes an objective employed for use with light energy having a wavelength in various ranges, including approximately 266 to 1000 nm, 157 nm through infrared, and other ranges. The objective includes a focusing lens group having at least one focusing lens configured to receive light, a field lens oriented to receive focused light energy from said focusing lens group and provide intermediate light energy, and a Mangin mirror arrangement positioned to receive the intermediate light energy from the field lens and form controlled light energy. Each focusing lens has a reduced diameter, such as a diameter of less than approximately 100 mm, and a maximum corrected field size of approximately 0.15 mm. An immersion substance, such as oil, water, or silicone gel, may be employed prior to passing controlled light energy to the specimen inspected.
公开/授权文献
- US20040240047A1 Catadioptric imaging system for broad band microscopy 公开/授权日:2004-12-02
信息查询
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B17/00 | 有或无折射元件的具有反射面的系统 |