Invention Grant
- Patent Title: Method for forming trenches in a semiconductor component
- Patent Title (中): 在半导体部件中形成沟槽的方法
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Application No.: US13004599Application Date: 2011-01-11
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Publication No.: US08679975B2Publication Date: 2014-03-25
- Inventor: Jochen Reinmuth , Barbara Will , Heribert Weber
- Applicant: Jochen Reinmuth , Barbara Will , Heribert Weber
- Applicant Address: DE Stuttgart
- Assignee: Robert Bosch GmbH
- Current Assignee: Robert Bosch GmbH
- Current Assignee Address: DE Stuttgart
- Agency: Kenyon & Kenyon LLP
- Priority: DE102010000888 20100114
- Main IPC: H01L21/60
- IPC: H01L21/60

Abstract:
A method is described for creating at least one recess in a semiconductor component, in particular a micromechanical or electrical semiconductor component, having the following steps: applying at least one mask to the semiconductor component, forming at least one lattice having at least one or more lattice openings in the mask over the recess to be formed, the lattice opening or lattice openings being formed as a function of the etching rate and/or the dimensioning of the recess to be formed; forming the recess below the lattice.
Public/Granted literature
- US20110169125A1 METHOD FOR FORMING TRENCHES IN A SEMICONDUCTOR COMPONENT Public/Granted day:2011-07-14
Information query
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