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发明授权
US08680015B2 Mitigating the effects of defects in high temperature semiconductor wires 有权
减轻高温半导体电线缺陷的影响

Mitigating the effects of defects in high temperature semiconductor wires
摘要：
A method includes locating a defect in a first segment of high temperature superconducting wire. A second segment of high temperature superconducting wire is then positioned onto the first segment of high temperature superconducting wire such that the second segment of high temperature superconducting wire overlaps the defect. A path is then created such that current flows through the second segment of high temperature superconducting wire. The first segment of high temperature superconducting wire and second segment of high temperature superconducting wire are then laminated together.
摘要（中）：

一种方法包括将缺陷定位在高温超导线的第一段中。 然后将高温超导线的第二段定位在高温超导线的第一段上，使得第二段高温超导线与缺陷重叠。 然后产生路径，使得电流流过高温超导线的第二段。 然后将第一段高温超导线和第二段高温超导线层压在一起。

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