发明授权
- 专利标题: Non-destructive inspection method and device
- 专利标题(中): 无损检测方法及装置
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申请号: US13501589申请日: 2010-10-08
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公开(公告)号: US08680477B2公开(公告)日: 2014-03-25
- 发明人: Hiroyuki Nose , Hajime Kuwabara , Tetsuya Kobayashi
- 申请人: Hiroyuki Nose , Hajime Kuwabara , Tetsuya Kobayashi
- 申请人地址: JP Tokyo
- 专利权人: IHI Corporation
- 当前专利权人: IHI Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2009-238332 20091015
- 国际申请: PCT/JP2010/067743 WO 20101008
- 国际公布: WO2011/046078 WO 20110421
- 主分类号: G01T1/16
- IPC分类号: G01T1/16
摘要:
A method of non-destructive inspection of a subject body including one or more elements comprises irradiating the subject body with a neutron ray along an axis line passing through a reference point; synchronously detecting gamma rays from directions inclined at equal angles to the axis line at a plurality of measurement points disposed to have equivalent intervals radially from the axis line, respectively; measuring the detected gamma rays in a plurality of energy ranges; determining whether measured values in the respective energy ranges are beyond thresholds; determining energy ranges where all the measured values are beyond the thresholds; analyzing a type of an element from the determined energy ranges; and detecting a location of the analyzed type of the element in the subject body on the basis of the reference point, the respective measurement points, a relative position relative to a surface of the subject body, and the directions.
公开/授权文献
- US20120199754A1 NON-DESTRUCTIVE INSPECTION METHOD AND DEVICE 公开/授权日:2012-08-09
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