发明授权
- 专利标题： Charged particle dose simulation device, charged particle beam irradiation device, charged particle dose simulation method, and charged particle beam irradiation method
- 专利标题（中）： 带电粒子剂量模拟装置，带电粒子束照射装置，带电粒子剂量模拟方法和带电粒子束照射方法
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申请号： US13267510申请日： 2011-10-06
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公开(公告)号： US08680487B2公开(公告)日： 2014-03-25
- 发明人: Teiji Nishio , Yuusuke Egashira , Manabu Yamada
- 申请人： Teiji Nishio , Yuusuke Egashira , Manabu Yamada
- 申请人地址： JP Tokyo JP Tokyo
- 专利权人： National Cancer Center,Sumitomo Heavy Industries, Ltd.
- 当前专利权人： National Cancer Center,Sumitomo Heavy Industries, Ltd.
- 当前专利权人地址： JP Tokyo JP Tokyo
- 代理机构： Squire Sanders (US) LLP
- 主分类号： A61N5/00
- IPC分类号： A61N5/00
摘要：
A simulation device includes an input unit which receives an input of simulation data including material information of the irradiation target and irradiation information of a charged particle beam, and an arithmetic unit which calculates the dose distribution of the charged particle beam in the irradiation target on the basis of simulation data received by the input unit and the dose distribution kernel. The arithmetic unit segments the charged particle beam spread to a predetermined range at an intermediate portion in the traveling direction of the charged particle beam, hypothesizes a plurality of virtual shapes having conical spread with a segmented position as a start point, and calculates the dose distribution of the charged particle beam in the irradiation target on the basis of simulation data received by the input unit and a plurality of virtual shapes of the charged particle beam.
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