Invention Grant
- Patent Title: Apparatus for measuring magnetic field of microwave-assisted head
- Patent Title (中): 用于测量微波辅助头磁场的装置
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Application No.: US13726767Application Date: 2012-12-26
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Publication No.: US08680855B2Publication Date: 2014-03-25
- Inventor: Isamu Sato , Hiroshi Ikeda , Mikio Matsuzaki , Tetsuya Roppongi , Noboru Yamanaka , Tsutomu Aoyama
- Applicant: TDK Corporation
- Applicant Address: JP Tokyo
- Assignee: TDK Corporation
- Current Assignee: TDK Corporation
- Current Assignee Address: JP Tokyo
- Agency: Posz Law Group, PLC
- Main IPC: G01R33/02
- IPC: G01R33/02

Abstract:
A measuring circuit system in a magnetic field measuring apparatus of the invention has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element, the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and with the measuring circuit system, an S/N ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier. With such a configuration, an in-plane high-frequency magnetic field generated by a microwave-assisted magnetic head is reliably and precisely measured.
Public/Granted literature
- US20130301162A1 APPARATUS FOR MEASURING MAGNETIC FIELD OF MICROWAVE-ASSISTED HEAD Public/Granted day:2013-11-14
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