Invention Grant
- Patent Title: Analysis method, radiation imaging apparatus using analysis method, and analysis program for executing analysis method
- Patent Title (中): 分析方法，辐射成像仪使用分析方法，分析程序执行分析方法
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Application No.: US13943932Application Date: 2013-07-17
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Publication No.: US08681934B2Publication Date: 2014-03-25
- Inventor: Kentaro Nagai , Toru Den
- Applicant: Canon Kabushiki Kaisha
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2008-278425 20081029
- Main IPC: G03H5/00
- IPC: G03H5/00
Abstract:
An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2π from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function.
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