Invention Grant
- Patent Title: Sub-microsecond-resolution probe microscopy
- Patent Title (中): 亚微分辨率探针显微镜
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Application No.: US13232859Application Date: 2011-09-14
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Publication No.: US08686358B2Publication Date: 2014-04-01
- Inventor: David Ginger , Rajiv Giridharagopal , David Moore , Glennis Rayermann , Obadiah Reid
- Applicant: David Ginger , Rajiv Giridharagopal , David Moore , Glennis Rayermann , Obadiah Reid
- Applicant Address: US WA Seattle
- Assignee: University of Washington through its Center for Commercialization
- Current Assignee: University of Washington through its Center for Commercialization
- Current Assignee Address: US WA Seattle
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01Q10/00
- IPC: G01Q10/00 ; G01Q60/24 ; G01B5/28
Abstract:
Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
Public/Granted literature
- US20120079630A1 SUB-MICROSECOND-RESOLUTION PROBE MICROSCOPY Public/Granted day:2012-03-29
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