发明授权
- 专利标题： Optical measurement apparatus and chip lifetime judgment method
- 专利标题（中）： 光学测量装置和芯片寿命判断方法
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申请号： US13568901申请日： 2012-08-07
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公开(公告)号： US08687195B2公开(公告)日： 2014-04-01
- 发明人: Yosuke Muraki
- 申请人： Yosuke Muraki
- 申请人地址： JP Tokyo
- 专利权人： Sony Corporation
- 当前专利权人： Sony Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： K&L Gates LLP
- 优先权： JP2011-175990 20110811
- 主分类号： G01N21/59
- IPC分类号： G01N21/59
摘要：
An optical measurement apparatus including a light irradiation portion configured to irradiate light onto a sample flowing through a flow path in a detachable chip; a light detection portion configured to detect optical information emitted from the sample when irradiated with the light by the light irradiation portion; and a judgment portion configured to judge an exchange period of the chip based on the optical information detected by the light detection portion.
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