Invention Grant
US08687401B2 Ferro-resistive random access memory (Ferro-RRAM), operation method and manufacturing method thereof 有权
铁电随机存取存储器(Ferro-RRAM),其操作方法及其制造方法

  • Patent Title: Ferro-resistive random access memory (Ferro-RRAM), operation method and manufacturing method thereof
  • Patent Title (中): 铁电随机存取存储器(Ferro-RRAM),其操作方法及其制造方法
  • Application No.: US13266752
    Application Date: 2011-01-12
  • Publication No.: US08687401B2
    Publication Date: 2014-04-01
  • Inventor: Anquan JiangXiaobing Liu
  • Applicant: Anquan JiangXiaobing Liu
  • Applicant Address: CN Shanghai
  • Assignee: Fudan University
  • Current Assignee: Fudan University
  • Current Assignee Address: CN Shanghai
  • Agency: McDonnell Boehnen Hulbert & Berghoff LLP
  • Priority: CN201010102118 20100128; CN201010175142 20100513
  • International Application: PCT/CN2011/000050 WO 20110112
  • International Announcement: WO2011/091709 WO 20110804
  • Main IPC: G11C11/22
  • IPC: G11C11/22
Ferro-resistive random access memory (Ferro-RRAM), operation method and manufacturing method thereof
Abstract:
The invention provides a Ferro-RRAM, a method of operating the Ferro-RRAM, and a method of fabricating the Ferro-RRAM, and pertains to the technical field of memory. The Ferro-RRAM comprises an upper electrode, a lower electrode, and a ferroelectric semiconducting thin-film layer provided between the upper electrode and the lower electrode and serving as a storage function layer; wherein the ferroelectric semiconducting thin-film layer is operable to generate a diode conduction characteristic by ferroelectric domain reorientation, and is operable to modulate the diode conduction characteristic by variation of the ferroelectric domain orientation; the Ferro-RRAM stores information according to variation of modulation of the diode conduction characteristic. The Ferro-RRAM has such characteristics of being simple in structure and fabrication, non-destructive readout and nonvolatile storage.
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