Invention Grant
US08687435B2 System and method for reducing pin-count of memory devices, and memory device testers for same 有权
用于减少存储器件引脚数量的系统和方法以及存储器件测试器相同

System and method for reducing pin-count of memory devices, and memory device testers for same
Abstract:
Methods, memory devices and systems are disclosed. In one embodiment, a non-volatile memory device receives command signals through the same input/output terminals that receive address signals and write data signals and transmit read data signals. The input/output terminals are connected to a multiplexer, which is responsive to a received mode control signal to couple the input/output terminals to either a command bus or an input/output bus. A latch in the memory device latches the command signals when the mode control signal causes the input/output terminals to be coupled to the input/output bus. As a result, the command signals continue to be applied to the command bus. When the mode control signal causes the input/output terminals to be coupled to the input/output bus, write data signals are clocked into the memory device and read data signals are clocked out of the memory device responsive to a received clock signal.
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