Invention Grant
US08687435B2 System and method for reducing pin-count of memory devices, and memory device testers for same
有权
用于减少存储器件引脚数量的系统和方法以及存储器件测试器相同
- Patent Title: System and method for reducing pin-count of memory devices, and memory device testers for same
- Patent Title (中): 用于减少存储器件引脚数量的系统和方法以及存储器件测试器相同
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Application No.: US13847189Application Date: 2013-03-19
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Publication No.: US08687435B2Publication Date: 2014-04-01
- Inventor: Scott N. Gatzemeier , Wallace E. Fister , Adam D. Johnson , Benjamin S. Louie
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C7/10
- IPC: G11C7/10

Abstract:
Methods, memory devices and systems are disclosed. In one embodiment, a non-volatile memory device receives command signals through the same input/output terminals that receive address signals and write data signals and transmit read data signals. The input/output terminals are connected to a multiplexer, which is responsive to a received mode control signal to couple the input/output terminals to either a command bus or an input/output bus. A latch in the memory device latches the command signals when the mode control signal causes the input/output terminals to be coupled to the input/output bus. As a result, the command signals continue to be applied to the command bus. When the mode control signal causes the input/output terminals to be coupled to the input/output bus, write data signals are clocked into the memory device and read data signals are clocked out of the memory device responsive to a received clock signal.
Public/Granted literature
- US20130229878A1 SYSTEM AND METHOD FOR REDUCING PIN-COUNT OF MEMORY DEVICES, AND MEMORY DEVICE TESTERS FOR SAME Public/Granted day:2013-09-05
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