Invention Grant
- Patent Title: Method for detecting orientation of contours
- Patent Title (中): 检测轮廓方向的方法
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Application No.: US12983643Application Date: 2011-01-03
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Publication No.: US08687897B2Publication Date: 2014-04-01
- Inventor: Eric Van Reeth , Pascal Bertolino , Nicolas Marina
- Applicant: Eric Van Reeth , Pascal Bertolino , Nicolas Marina
- Applicant Address: FR Grenoble
- Assignee: STMicroelectronics (Grenoble 2) SAS
- Current Assignee: STMicroelectronics (Grenoble 2) SAS
- Current Assignee Address: FR Grenoble
- Agency: Gardere Wynne Sewell LLP
- Priority: FR1050034 20100105
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N3/30 ; G06T7/00 ; G06K9/74

Abstract:
A method for detecting orientation of the contours in an image, performs an initial transformation of the image using a non-decimated multi-resolution transform, segments the image into a plurality of blocks, determines the optimal resolution for each block, and detects the predominant direction of contour for each of the blocks.
Public/Granted literature
- US20110164831A1 METHOD FOR DETECTING ORIENTATION OF CONTOURS Public/Granted day:2011-07-07
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