Invention Grant
- Patent Title: Automatic calibration procedure of temperature compensation for digital pressure gauges
- Patent Title (中): 数字压力表的温度补偿自动校准程序
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Application No.: US13310946Application Date: 2011-12-05
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Publication No.: US08689635B2Publication Date: 2014-04-08
- Inventor: Li-Jen Shih
- Applicant: Li-Jen Shih
- Applicant Address: TW Kaohsiung
- Assignee: Taiwan Silicon Microelectronics Co., Ltd.
- Current Assignee: Taiwan Silicon Microelectronics Co., Ltd.
- Current Assignee Address: TW Kaohsiung
- Agency: Rosenberg, Klein & Lee
- Main IPC: G01L19/04
- IPC: G01L19/04

Abstract:
An automatic operation method for setting temperature compensation coefficients of a digital pressure gauge is revealed. Primarily, a microcontroller unit (MCU) in the pressure gauge is equipped with built-in calibration procedures. The gauge is placed into a temperature-controlled chamber in order to obtain the temperature coefficient of offset (Tco) and temperature coefficient of span (Tcs). This method is the automatic measuring outputs of zero pressure/full scale at two temperatures to calculate the temperature coefficients Tco/Tcs. The two temperature compensation coefficients are stored in the MCU inside the pressure gauge. As the pressure gauge operates in any working temperature environments, the gauge based on a certain algorithm formula with the two stored temperature coefficients shows an accurate pressure reading.
Public/Granted literature
- US20120285253A1 AUTOMATIC CALIBRATION PROCEDURE OF TEMPERATURE COMPENSATION FOR DIGITAL PRESSURE GAUGES Public/Granted day:2012-11-15
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