发明授权
US08693000B2 Quantitative phase microscopy for label-free high-contrast cell imaging
有权
用于无标记的高对比度细胞成像的定量相位显微术
- 专利标题： Quantitative phase microscopy for label-free high-contrast cell imaging
- 专利标题（中）： 用于无标记的高对比度细胞成像的定量相位显微术
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申请号： US13335748申请日： 2011-12-22
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公开(公告)号： US08693000B2公开(公告)日： 2014-04-08
- 发明人: Evgenia Mikhailovna Kim , Robert John Fikins , Chulmin Joo
- 申请人： Evgenia Mikhailovna Kim , Robert John Fikins , Chulmin Joo
- 申请人地址： US NY Niskayuna
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Niskayuna
- 代理商 Jenifer Haeckl
- 主分类号： G01B9/02
- IPC分类号： G01B9/02 ; G02B21/00
摘要：
Systems and methods described herein employ multiple phase-contrast images with various relative phase shifts between light diffracted by a sample and light not diffracted by the sample to produce a quantitative phase image. The produced quantitative phase image may have sufficient contrast for label-free auto-segmentation of cell bodies and nuclei.
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