发明授权
- 专利标题: Testing apparatus and method for testing light emitting diode lamp
- 专利标题(中): 发光二极管灯测试装置及方法
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申请号: US12985734申请日: 2011-01-06
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公开(公告)号: US08705023B2公开(公告)日: 2014-04-22
- 发明人: Sungho Hong , Jang Gu Oh , Tae Young Choi , Jong Tae Park
- 申请人: Sungho Hong , Jang Gu Oh , Tae Young Choi , Jong Tae Park
- 申请人地址: KR Seoul
- 专利权人: LG Innotek Co., Ltd.
- 当前专利权人: LG Innotek Co., Ltd.
- 当前专利权人地址: KR Seoul
- 代理机构: McKenna Long & Aldridge LLP
- 优先权: KR10-2010-0025488 20100322; KR10-2010-0025490 20100322
- 主分类号: G01J1/00
- IPC分类号: G01J1/00 ; G01J1/42
摘要:
Disclosed is an apparatus for testing an LED lamp which includes: a secured seat on which the LED lamp is seated; an up and down shifter which, when the LED lamp is seated on the secured seat, shifts from an initial position spaced upward from the LED lamp to a measurement position in which the up and down shifter contacts with a socket of the LED lamp, and which supplies electric power to the LED lamp when the up and down shifter is placed in the measurement position, and a sensor sensing that the up and down shifter is placed in the measurement position; and a quality determining means determining a quality of the LED lamp based on light emitted from the LED lamp, and comprising an illuminometer or a luminance meter.