发明授权
- 专利标题: Microscopy method and microscope with enhanced resolution
- 专利标题(中): 显微镜方法和显微镜具有更高的分辨率
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申请号: US12913487申请日: 2010-10-27
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公开(公告)号: US08705172B2公开(公告)日: 2014-04-22
- 发明人: Ingo Kleppe , Ralf Netz , Yauheni Novikau
- 申请人: Ingo Kleppe , Ralf Netz , Yauheni Novikau
- 申请人地址: DE Jena
- 专利权人: Carl Zeiss Microscopy GmbH
- 当前专利权人: Carl Zeiss Microscopy GmbH
- 当前专利权人地址: DE Jena
- 代理机构: Duane Morris LLP
- 优先权: DE102009051291 20091028
- 主分类号: G02B21/06
- IPC分类号: G02B21/06
摘要:
Method for enhancing the resolution of a microscope during the detection of an illuminated specimen and a microscope for carrying out the method, wherein in a first position, an illumination pattern is generated on the specimen, the resolution of which is preferably within the range of the attainable optical resolution of the microscope or higher, wherein a relative movement, preferably perpendicular to the direction of illumination, from a first into at least one second position of the illumination pattern on the specimen is generated at least once between the detection and the illumination pattern with a step width smaller than the resolution limit of the microscope and detection and storage of the detection signals take place both in the first and in the second position.
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