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US08705298B2 Method and apparatus for memory fault tolerance 有权
存储器容错的方法和装置

Method and apparatus for memory fault tolerance
Abstract:
One or more circuits may include an array of memory cells corresponding to a particular memory address. The one or more circuits may be operable to discover a location of a faulty memory cell in the array of memory cells. The one or more circuits may be operable to arrange the order in which the bits of a data block are stored to said array of memory cells based, at least in part, on said discovered location of said faulty memory cell.
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