Invention Grant
- Patent Title: Electromagnetic probe for measuring properties of a subsurface formation
- Patent Title (中): 用于测量地下地层特性的电磁探头
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Application No.: US13345749Application Date: 2012-01-08
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Publication No.: US08710846B2Publication Date: 2014-04-29
- Inventor: Matthieu Simon , Henri Budan , Laurent Mosse , Mehdi Hizem
- Applicant: Matthieu Simon , Henri Budan , Laurent Mosse , Mehdi Hizem
- Applicant Address: US TX Sugar Land
- Assignee: Schlumberger Technology Corporation
- Current Assignee: Schlumberger Technology Corporation
- Current Assignee Address: US TX Sugar Land
- Agent Stephanie Chi; Jody DeStefanis
- Priority: EP05290389 20050222
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
A probe for measuring electromagnetic properties of a subsurface formation includes a pad having a face adapted for engagement with a borehole wall, a pair of transmitting antennas, and two pairs of receiving antennas. The transmitting antennas and receiving antennas are mounted in the face of the pad, and each of the two pairs of receiving antennas include a first and second antenna distributed on opposite sides of the pair of transmitting antennas. The probe further includes an electronic arrangement having a transmitter module and a receiver module. The transmitter module is arranged to operate the pair of transmitting antennas in either a broadside mode or an endfire mode by applying an excitation signal modulated by two or more frequencies, and the receiver module is arranged to determine an attenuation and a phase shift of each reception signal provided by each receiving antenna relatively to the excitation signal.
Public/Granted literature
- US20130009646A1 Electromagnetic Probe Public/Granted day:2013-01-10
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